The Scintag Polycrystalline-Texture-Stress (PTS) 4-circle goniometer, equipped with a sealed x-ray tube, can be used for residual stress measurements where a x-ray intensity is high and a spot size >1 mm is adequate, e.g. stress measurements in metal specimens. Studies of crystallographic texture or preferred orientation (by collecting one or more pole figures) are also ideal for this unit. Diffraction methods are widely accepted as the most general method of quantifying the texture of materials.

The rugged open Eulerian cradle of the PTS goniometer allows the study of large specimens over a wide tilt and Bragg angle range. The tube tower is shown to the right with a long pinhole collimator for the incident beam.

Properties of materials are heavily dependent on their near surface residual stress and texture, often a result of the manufacturing processes that include rolling, hot pressing, preferred crystalline growth, and epitaxy. Texture affects such important design and processing properties as yield, strength, corrosion resistance, formability, thermal transport, magnetic properties, and electrical conductivity.

Features:

• Interchangeable, 2-kW x-ray tubes (Cu, Cr, Co, W, Fe, Mo)
• Divergent-beam and near parallel-beam optics
• Scintag PTS four-axis goniometer for texture and stress analysis
• Unrestricted 2-theta range (from -2 to 165 degrees)
• Sample X, Y, and Z translations
• Solid-state detection of x-rays
• Optional position sensitive detector for rapid data collection
• Specimen dimensions up to 140 mm in diameter, 40 mm in thickness, and 5 kg in mass
• Highly automated, flexible data collection and analysis options
• Stress analysis uses the same data collection and analysis routines as the high-flux rotating anode system