Instruments

 

Below is a listing of the various instruments used at the different HTML User Centers. They are listed by the user center laboratory that they reside in.

This instrument list can also be downloaded and is provided here in Adobe PDF formats.

 

Diffraction User Center (DUC)(Neutron & X-Ray) – Andrew Payzant (865-574-6538)

 
  • X-ray Diffraction:
    • High-Temperature
    • Low-Temperature
    • Room-Temperature
  • Neutron* Diffraction:
    • 1600°C Vacuum Furnace
    • Controlled Atmosphere Furnace - 1200°C (air)
    • Room Temperature
  • Synchrotron High-Flux Beam Line (X14A at NSLS):
    • RT Capillary Mount
    • Buehler Furnace
    • Capillary Furnace

    *Joint-venture facility with primary funding for the High Flux Isotope Reactor from DOE’s Basic Energy Sciences

Materials Analysis User Center Instruments (MAUC) – Larry Allard (865-574-4981)

 
  • Hitachi HF-3300 cold FE-STEM/TEM*
  • Hitachi NB-5000 dual-beam FIB Micro Mill
  • Hitachi S3400 Environmental SEM
  • JEOL 2200FS-AC Aberration-corrected FE-TEM*
  • JEOL 8200 Electron Microprobe
  • K-Alpha X-ray Photoelectron Spectrometer
  • Phi 680 FE – Scanning Auger Nanoprobe

*Remote access available, check if required.

 

 

Mechanical Characterization & Analysis User Center Instruments (MCAUC) – Edgar Lara-Curzio (865-574-1749)

 
  • Biaxial Test System (Torsion/Tension-Compression)
  • Dilor XY800 Raman Microprobe
  • Dynamic Mechanical Analyzer
  • Electromechanical Test System
  • Flexure Test Facility
  • Hardness Tester
  • Micromechanical Test System
  • Nanoindenter
  • Resonant Ultrasound Spectrometer
  • Servohydraulic Test System
  • Tensile Test Facility
  • Test machine for automotive crashworthiness (TMAC)
  • Thermal Shock Test Facility
  • Thermomechanical Analyzer
  • Ultrasonic Modulus System

Residual Stress/Texture User Center (RSUC) – Cam Hubbard (865-574-4472)

 
  • Neutron* Diffraction Residual Stress Mapping (Macro)
    • Large Specimen XYZ Stage
    • 2-Circle Orienter
    • Load Frame
    • 1600°C Vacuum Furnace
  • Neutron* Powder Diffraction (High Temperature Furnace/Microstresses)
    • Controlled Atmosphere Furnace - 1200°C (air)
    • Room Temperature
  • XRD X’Pert pro with Anton Paar Hot Stage – Rotating anode
  • XRD Polycrystal-Texture-Stress Goniometer – Standard X-ray tube
  • Synchrotron High-Flux X-ray Beam Line (at NSLS)
  • XRD TEC Large Specimen Goniometer
*Joint-venture facility with primary funding for the High Flux Isotope Reactor from DOE’s Basic Energy Sciences

Thermography and Thermophysical Properties User Center Instruments (TTPUC) – Ralph Dinwiddie (865-574-7599)

 
  • Differential Scanning Calorimeter
    • High Temperature DSC
    • Low Temperature modulated DSC
  • Dilatometer
    • Dual Push Rod (1500°C)
    • High Speed Quenching, Deformation, or Cryogenic Cooling
  • Electrical Resistivity (4-point in-line probe)
  • High Temperature Seebeck Coefficient/Electrical Resistivity
  • Thermal Analysis
    • Simultaneous DTA/TG
    • High Mass TGA
  • Thermal Constants Hot Disk System
  • Thermal Diffusivity
    • LaserPit in-plane
    • Laser Flash
    • Xenon Flash
  • Thermography – IR Camera (available for offsite research)
  • Hyperspectral Imaging (available for offsite research)
  • Thermosonic NDE
  • Total Hemispherical Emittance


Tribology Research User Center Instruments (TRUC) – Peter Blau (865-574-5377)

 
  • Compact Grindability Test System (high-stress abrasion)
  • Continuous Loop Abrasion Test (low-stress abrasion)
  • Coordinate Measuring Machine
  • Durometer – Elastomer Hardness Tester
  • Hardness Tester, Rockwell and superficial scales, ASTM compliant
  • Image Analyzer (optical microscopy)
  • Microindentation Hardness Tester
    • High temperature
    • Room temperature
  • Multi-mode Rolling/Sliding Friction & Wear
  • Optical Comparator
  • Oscillatory Scuffing Tester, High temperature
  • Pin-on-Disk
    • High temperature
    • Room temperature
  • Precision Roundness Measurement
  • Reciprocating friction/wear
    • High-load
    • Low-load
  • Repetitive Impact Testing System
    • High temperature
    • Room temperature
  • Scanning Acoustic Microscope
  • Scratch Test, Instrumented (Revetest)
  • Subscale Disk Brake Material Tester
  • Surface roughness measuring system, 2D, Mechanical stylus type
  • Surface topography imaging, 2D and 3D
    • High resolution with image stitching
    • Non-contact, laser-based
     

 Oak Ridge National Laboratory