Diffraction User Center has both exceptional facilities
as well as powerful software to analyze
crystallite size and stain broadening

   DUC

  Residual Stress User Center
  Thermophysical Properties User Center
  Diff. and Therm. Prop. Group
  High Temperature Materials Laboratory
  Metals and Ceramics Division
  Oak Ridge National Laboratory


XRAYL uses profile fitting to resolve overlapping profiles and then regenerates the individual profile for each hkl in the overlap region for use in CRYSIZ

CRYSIZ performs Hall-Williamson and Warren-Averbach analyses for crystallite size and root-mean-square microstrain.

Both programs are written in machine independent FORTRAN77. Test decks and expected output files are provided.





You can download PDF files of the ORNL reports for the XRAYL and CRYSIZ software. Each report includes the software. Just click on the name of the report that you want to download
XRAYL      CRYSIZ

If you do not have Adobe's Acrobat Reader, download it free from Adobe  .

DUC | Instruments | Applications | Recent Projects | Publications | Staff | Map

 User Facility Access and Proposal Form


Diffraction UC | Residual Stress UC | Thermophysical Properties UC
Diffraction & Thermophysical Prop. Group | High Temperature Materials Laboratory
Metals & Ceramics Division | Oak Ridge National Laboratory

Acknowledgments
URL: http://www.html.ornl.gov/duc/xrayl2.html