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Features:
- Cu or Cr radiation
- Quick change optics allows for rapid experimental
change-over
- Incident beam optics
- Programmable divergence slit
- Parabolic multilayer mirror (Cu radiation)
- Parabolic poly-capillary lens (Cu or Cr)
- Diffracted beam optics
- Programmable receiving slit
- Radial divergence limiting slits (also
known as: thin film attachment, parallel plate collimator, long
Soller slits)
- Detectors
- High count rate (500k c/s) proportional
detector with curved diffraction side graphite monochromators
for precision measurements with Cu or Cr radiation
- Position sensitive detector for high
speed measurements
- High temp stage operates in oxidizing, reducing,
or inert gas environments at temperatures up to 900°C
- He, Ar, N2, ambient air, mixed
gases
- State-of-the-art data handling with peak
search, deconvolution, automated pattern indexing, standard calibration,
and lattice parameter refinement
- Rietveld and whole-pattern fitting capabilities
for studies of structure and quantitative phase analysis
- Stress analysis
5Si3.gif)
Applications:
- High temperature residual stress measurements
with parallel beam optics
- Thermal expansion measurements with parallel
beam optics
- Measurement of oxidation kinetics
- Phase equilibria studies
- In-situ process simulation
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