ROOM TEMPERATURE X-RAY DIFFRACTOMETERS

ROOM TEMPERATURE X-RAY DIFFRACTOMETERS

Features:

Scintag PADV vertical theta/2-theta goniometer
Scintag XDS2000 horizontal, theta/2-theta goniometer
Solid state detector - high signal-to-noise ratio
Choice of single or 4-position sample changer with spinner
Choice of radiation (Cu, Mo, Cr, Co, Ag, Fe)

Applications:

State-of-the-art data handling with peak search, deconvolution, and standard calibration
Phase identification with computer search-match using the entire Powder Diffraction File
Automated pattern indexing
Rietveld structure refinement
Lattice parameter refinement
Crystallite size and microstrain determination
Quantitative analysis

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User Facility Access and Proposal Form

Diffraction UC | Residual Stress UC | Thermophysical Properties UC
Diffraction & Thermophysical Prop. Group | High Temperature Materials Laboratory
Metals & Ceramics Division | Oak Ridge National Laboratory

Acknowledgments
URL: http://www.html.ornl.gov/duc/room-temp.html