Rietveld methods refine a large number of variables
to fit collected diffraction data

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Refined variables may include:
  • structural parameters
    • lattice constants
    • atomic positions
    • thermal parameters
    • site occupancy
  • instrumental broadening
    • peak asymmetry
    • Lorentz and polarization
    • axial divergence
  • background coefficients
  • microstrain broadening
  • crystallite size broadening
  • quantitative phase analysis


Rietveld refinement using GSAS on BaTiO3 powders provided structural parameters as a function of processing temperature.
(Safari and Akdogan, Rutgers University)

Room Temperature X-Ray Diffractometer


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Acknowledgments