Whole-pattern-fitting Rietveld refinement
offers characterization advantages

   DUC

  Residual Stress User Center
  Thermophysical Properties User Center
  Diff. and Therm. Prop. Group
  High Temperature Materials Laboratory
  Metals and Ceramics Division
  Oak Ridge National Laboratory


  • Crystal structure information is gained for samples that are difficult (or impossible) to synthesize in a form suitable for single crystal analysis

  • Solid solutions and multi phase specimens can be characterized for atomic structure, site occupancy, quantitative phase content, and microstructural characteristics.

  • GSAS (General Structure Analysis System) can combine data from different radiation sources 
    • neutron radiation - sensitive to light elements
    • synchrotron radiation - high intensity, high resolution, tunable wavelengths
    • conventional x-ray - convenient


Refined variables may include:
  • structural parameters
    • lattice constants
    • atomic positions
    • thermal parameters
    • site occupancy
  • instrumental broadening
    • peak asymmetry
    • Lorentz and polarization
    • axial divergence
  • background coefficients
  • microstrain broadening
  • crystallite size broadening
  • quantitative phase analysis
Above: GSAS refinement on LaB6 (NIST SRM660) powder used to define laboratory instrumental parameters
Below: Rietveld refinement using GSAS on BaTiO3 powders provided crystallite size, microstrain and structural parameters as a function of processing temperature.
(Safari and Akdogan, Rutgers University)

High Temperature X-Ray Diffractometer


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Acknowledgments

URL: http://www.html.ornl.gov/duc/pattern.html